TI SN74LVTH18512DGGR

扫描测试通用总线收发器18 位2.7V ~ 3.6V

Overview

The 'LVTH18512 and 'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

The SN54LVTH18512 and SN54LVTH182512 are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18512DGGR and SN74LVTH182512 are characterized for operation from -40°C to 85°C.

Features

74LVTH Series
64-TFSOP (0.240, 6.10mm Width) package
74LVTH series
74LVTH18512 family
64 pin count
64 pins
2 elements

Surface Mount Mounting Type

Applications

There are a lot of Texas Instruments
SN74LVTH18512DGGR Universal Bus Functions applications.

• Tablets
• Industrial Controls
• Telecommunications
• Instrumentation Systems
• Air conditioner
• Home theater
• Electric grinding wheel
• Electrical tools
• Sewing machine
• DVD