NS SCANSTA111SM-NS

测试设备IEEE 1149.13V ~ 3.6V表面贴装型

Overview

The SCANSTA111SM extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111SM supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be performed on one port while other scan chains are simultaneously tested.

Features

Bulk Package
Testing Equipment Applications
IEEE 1149.1 Interface
3V ~ 3.6V Voltage - Supply
Surface Mount Mounting Type